ENERGY-DISPERSIVE X-RAY MICROANALYSIS

• Foreign Particle Analysis
• Semi-Quanitative Analysis (Standards Necessary)
• Elemental X-Ray Mapping (SEM only)

This technique of analysis is based on the principle that, when an atom is bombarded with sufficient energy from the beam of an electron microscope, an energy loss is created through an exchange of electrons in the atomic shells. This energy loss is emitted as an x-ray with specific characteristics that identify the atom.